A mechanism is provided for measuring the absolute duty cycle of a signal anywhere on an integrated circuit device. The mechanism employs a circuit having a plurality of substantially identical pulse shaper elements, each of which expand the pulse of an input signal whose duty cycle is to be measured...http://www.google.com/patents/US7895005?utm_source=gb-gplus-sharePatent US7895005 - Duty cycle measurement for various signals throughout an integrated circuit device
Duty cycle measurement for various signals throughout an integrated circuit ...
