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A scanning probe apparatus includes a measurement probe tip and an auxiliary probe tip that is movably positionable with respect to the measurement probe tip. The measurement probe tip and the auxiliary probe tip may be positioned juxtaposed, so that an electrical discharge may be effected between the measurement probe tip and auxiliary probe tip to remove a contaminant from the measurement probe tip. The auxiliary probe tip may be integral with a sample support plate within the scanning probe apparatus.

Inventors: Lin Zhou, Dmitriy Shneyder
Original Assignee: International Business Machines Corporation
Primary Examiner: Thomas P Noland
Attorneys: Scully, Scott, Murphy & Presser, P.C., Rosa Suazo Yaghmour, Esq.
Current U.S. Classification: 134/1; 850/17

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Citations

Cited PatentFiling dateIssue dateOriginal AssigneeTitle
US7495240May 2, 2006Feb 24, 2009Rave LLCApparatus and method for modifying an object
US20070131249Dec 4, 2006Probe washing method of scanning probe microscope

Claims

1. A method for cleaning a scanning probe apparatus probe tip comprising:

positioning one of an auxiliary probe tip and a measurement probe tip in a vicinity of the other of the auxiliary probe tip and the measurement probe tip in-situ within a scanning probe apparatus, wherein positioning of one of the auxiliary probe tip and the measurement probe tip uses:

a measurement probe tip that is integral with a support member within the scanning probe apparatus, and

an auxiliary probe tip that is integral with a sample carrier plate within the scanning probe apparatus, and after positioning said auxiliary probe tip is located opposite and at a distance from about 0.01 to about 10 microns with respect to the measurement probe tip; and

generating an electrical discharge between the auxiliary probe tip and the measurement probe tip, wherein the generating the electrical discharge removes a particulate contaminant material from the measurement probe tip.

Drawings