inassignee:"Hough Paul V C"

3 results

www.google.com/patents/US20030146380

‎

An atomic force microscope utilizes a pulse release system and improved
method of operation to minimize contact forces between a probe tip ...

www.google.com/patents/US20050029450

‎

An atomic force microscope is described having a cantilever comprising a base
and a probe tip on an end opposite the base; a cantilever drive ...

www.google.com/patents/US3069654

‎

Dec. 18, 1962 P. v. c. HouGH METHOD AND MEANS FOR RECOGNIZING
COMPLEX PATTERNS Filed March 25. 1960 2 Sheets-Sheet l INVENTOR. ,Paal
M ...

Account Options