| 3 results  | www.google.com/patents/US20030146380 An atomic force microscope utilizes a pulse release system and improved
method of operation to minimize contact forces between a probe tip ... |
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 | www.google.com/patents/US20050029450 An atomic force microscope is described having a cantilever comprising a base
and a probe tip on an end opposite the base; a cantilever drive ... |
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 | www.google.com/patents/US3069654 Dec. 18, 1962 P. v. c. HouGH METHOD AND MEANS FOR RECOGNIZING
COMPLEX PATTERNS Filed March 25. 1960 2 Sheets-Sheet l INVENTOR. ,Paal
M ... |
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