| 9 results  | www.google.com/patents/EP1998207A2?cl=en The invention relates to an apparatus where the sample (4) is placed between an
optical microscope (130) and an SEM column (102) on an ... |
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 | www.google.com/patents/EP2924709A1?cl=en A multi-beam apparatus for inspecting or processing a sample (232) with a
multitude of focused beams, the apparatus equipped to scan a ... |
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 | www.google.com/patents/EP2924708A1?cl=en The invention relates to a multi-beam apparatus for inspecting a sample (232)
with a multitude of focused beams, the apparatus equipped to ... |
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 | www.google.com/patents/EP2924710A1?cl=en The invention relates to a multi-beam apparatus (210) for inspecting a sample (
232) with at least a first focused beam and a second focused ... |
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 | www.google.com/patents/EP2239628A1?cl=en The invention relates to a method for forming microscopic 3D structures. In the
method according to the invention a substrate (105) is placed in ... |
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 | www.google.com/patents/EP2233906A1?cl=en Dual beam instruments, comprising a Scanning Electron Microscope (SEM)
column for imaging and a Focused Ion Beam (FIB) column for ... |
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 | www.google.com/patents/EP3125272A1?cl=en A scanning-type Charged Particle Microscope, comprising: - A specimen holder,
for holding a specimen; - A source, for producing a beam of ... |
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 | www.google.com/patents/EP2590204A1?cl=en A method of investigating a sample using a charged-particle microscope,
comprising the steps of: - Providing a charged-particle microscope ... |
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 | www.google.com/patents/EP2602807A1?cl=en A method of investigating a sample using a charged-particle microscope,
comprising the steps of: - Providing a charged-particle microscope ... |
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